eTraining Introduction How to Use This Module Introduction Choosing the Preparation Method Mount Fabrication Procedure Steel Etching Procedure Steel Polishing Procedure Rocks and Minerals Equipment Procedure Introduction Jet Spraying Lofting Suspension Odd Shapes - Fractures Cryo Fracture Technique Electronic Materials and Carbon Nanotubes Multiprep Polishing Procedure Handling Specimen Coating Reasons for Coating Metal Coating Procedure Carbon Coating Procedure Introduction Specimen Holders by Instrument Overview Interactive Parts Tour Operating Procedures Overview Chemicals and Materials Solution Preparation Chemical Calculations Fixation and Dehydration Mounting Safety and Disposal References Form and Function Signal Source and Detection Interactive Parts Tour Interactive Cutaway Tour Safety Procedures Operating Procedures Basic Imaging Advanced Imaging Shut Down FAQs Troubleshooting VIDEO: Specimen Loading Technique VIDEO: Start Up Technique VIDEO: Specimen Unloading Technique Form and Function 1 Form and Function 2 Chemical Analysis Interactive Parts Tour Interactive Cutaway Tour Software Tour Safety Procedures Preliminary Specimen Exchange Flashing Imaging Shut Down Backscatter Imaging Charging Specimen Types X-Ray Spectral Analysis X-Ray Mapping Why Use FESEM? Specimen Constraints General FAQs Troubleshooting X-Rays and Spectra Energy Dispersive Spectrometer Wavelength Dispersive Spectrometer Safety Procedures EDS Versus WDS Quantitative X-Ray Microanalysis Basic Science Interactive X-Ray Mapping Challenge FAQs Troubleshooting Overview Tapping Mode Laser Alignment Preliminary Alignment Operation Image Viewing/Offline Operation Shut Down System Requirements Alternative Content Contact General Lab Safety Disclaimers Usage Permissions Site Map

Basic Imaging

Beam Settings

1. Low Magnification (< 10k x or X-ray microanalysis)    
1.1. Working distance: 39 mm
1.2. Condenser lens: 7-10
1.3. Aperture setting: 1st or 2nd position
2. High Magnification (> 10k x)    
2.1. Working distance: 8-15 mm
2.2. Condenser lens: 10-14
2.3. Aperture setting: 3rd or 4th position

Focus and Magnification

1. To focus, zoom in to approximately 10x the magnification for an image (if the image is to acquired at <1000x) and 2-5x (if the image is to be acquired at >1000x). Use the FINE focus and look for stretching of the image. VIEW
2. If the image stretches as you move through the point of focus, you will need to correct for stigmation.    
3. The first step of stigmating is to focus the image as well as you can. Then, manipulate the STIGMATOR X/Y knobs individually to achieve the best image. Refocus the image.    
4. Repeat this until there is no stigmation present.    
5. Zoom out to the desired magnification. NOTE: DO NOT try to adjust the focus once you zoom out. If the image is focused at a higher magnification, it will be in focus at a lower magnification. NOTE: DO NOT focus and stigmate directly on an area of interest. This will damage the sample.    

Adjusting Contrast and Brightness

1. Depress the DISPLAY WFM on the control panel. This should bring up 6 horizontal, stationary lines on the screen. VIEW
2. Use the SE IMAGE BRIGHTNESS knob and SE IMAGE CONTRAST knob to control the moving line. The base of the signal should be at the second line from the bottom. The highest peak should be just above the top of the lines. VIEW
3. Depress the WFM button to get back to an image. VIEW

Acquiring a Digital Image

1. In dPict32 select Acquire > Setup Beam Raster. VIEW
2. If you have a folder for image storage, specify it in the Image Folder section of the Setup Beam Raster window. If you do not have a folder, create one in My Computer.    
3. In the window, you need to specify: VIEW
3.1. File name
3.2. Image title
3.3. Magnification
3.4. Number of pixels (usually 500 to 1000)
3.5. Sample per pixel: 25; Sampling rate: 400
4. Be sure that the image Selector is checked with the SEI tag.    
5. Select Acquire.    
6. Wait for the entire image to appear before doing anything. Save the image if it is satisfactory. NOTE: Always remove your data from the PC. Files are subject to deletion at any time.    

Top of Page