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Basic Imaging

Beam Settings

1. Low Magnification (< 10k x or X-ray microanalysis)    
1.1. Working distance: 39 mm
1.2. Condenser lens: 7-10
1.3. Aperture setting: 1st or 2nd position
2. High Magnification (> 10k x)    
2.1. Working distance: 8-15 mm
2.2. Condenser lens: 10-14
2.3. Aperture setting: 3rd or 4th position

Focus and Magnification

1. To focus, zoom in to approximately 10x the magnification for an image (if the image is to acquired at <1000x) and 2-5x (if the image is to be acquired at >1000x). Use the FINE focus and look for stretching of the image. VIEW
2. If the image stretches as you move through the point of focus, you will need to correct for stigmation.    
3. The first step of stigmating is to focus the image as well as you can. Then, manipulate the STIGMATOR X/Y knobs individually to achieve the best image. Refocus the image.    
4. Repeat this until there is no stigmation present.    
5. Zoom out to the desired magnification. NOTE: DO NOT try to adjust the focus once you zoom out. If the image is focused at a higher magnification, it will be in focus at a lower magnification. NOTE: DO NOT focus and stigmate directly on an area of interest. This will damage the sample.    

Adjusting Contrast and Brightness

1. Depress the DISPLAY WFM on the control panel. This should bring up 6 horizontal, stationary lines on the screen. VIEW
2. Use the SE IMAGE BRIGHTNESS knob and SE IMAGE CONTRAST knob to control the moving line. The base of the signal should be at the second line from the bottom. The highest peak should be just above the top of the lines. VIEW
3. Depress the WFM button to get back to an image. VIEW

Acquiring a Digital Image

dPict7 Toolbar

dPict7 Toolbar

The software and icons refer to the dPict7 software. Click the toolbar above for a larger view.

1. In dPict7 select Acquire > Setup Beam Raster. VIEW
2. In the Setup Beam Raster dialog, use Browse to select the correct Image Folder. Enter the File Name and Image Title.    
3. Enter the correct Magnification as it appears on the left CRT monitor. NOTE: The Append Mag to Title icon will add the magnification to the Image Title.    
4. Select the proper scanning conditions:    
4.1. Fast Scan: This is good for samples easily damaged by the beam, but the images are noisy. Select the IMS-1 Fast option and change the Tag to reflect either SEI of BEI conditions. Samples per Pixel: 40 and Sampling Rate: 400 kHz.
4.2. Slow Scan: This provides the best quality images. Select the IMS-1 Slow option and change the Tag to reflect either SEI of BEI conditions. Samples per Pixel: 0.1 or 0.2.
5. Make sure the File Type reads is TIF 8-bit.    
6. Once the imaging conditions have been selected, change the SEM Scan Speed to Slow.    
7. In the dPict7 Setup Beam Raster menu, select Acquire to begin the image collection.    

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