eTraining Introduction How to Use This Module Introduction Choosing the Preparation Method Mount Fabrication Procedure Steel Etching Procedure Steel Polishing Procedure Rocks and Minerals Equipment Procedure Introduction Jet Spraying Lofting Suspension Odd Shapes - Fractures Cryo Fracture Technique Electronic Materials and Carbon Nanotubes Multiprep Polishing Procedure Handling Specimen Coating Reasons for Coating Metal Coating Procedure Carbon Coating Procedure Introduction Specimen Holders by Instrument Overview Interactive Parts Tour Operating Procedures Overview Chemicals and Materials Solution Preparation Chemical Calculations Fixation and Dehydration Mounting Safety and Disposal References Form and Function Signal Source and Detection Interactive Parts Tour Interactive Cutaway Tour Safety Procedures Operating Procedures Basic Imaging Advanced Imaging EDS X-Ray Spectral Analysis EDS X-Ray Mapping WDS Quantitative Analysis Procedure WDS X-Ray Mapping Overview WDS X-Ray Mapping Procedure Shut Down FAQs Troubleshooting VIDEO: Specimen Loading Technique VIDEO: Start Up Technique VIDEO: Specimen Unloading Technique Form and Function 1 Form and Function 2 Chemical Analysis Interactive Parts Tour Interactive Cutaway Tour Software Tour Safety Procedures Preliminary Specimen Exchange Flashing Imaging Shut Down Backscatter Imaging Charging Specimen Types X-Ray Spectral Analysis X-Ray Mapping Why Use FESEM? Specimen Constraints General FAQs Troubleshooting X-Rays and Spectra Energy Dispersive Spectrometer Wavelength Dispersive Spectrometer Safety Procedures EDS Versus WDS Quantitative X-Ray Microanalysis Basic Science Interactive X-Ray Mapping Challenge FAQs Troubleshooting Overview Tapping Mode Laser Alignment Preliminary Alignment Operation Image Viewing/Offline Operation Shut Down System Requirements Alternative Content Contact General Lab Safety Disclaimers Usage Permissions Site Map

Why Use FESEM?

The FESEM has many capabilities that extend beyond those of a tungsten filament SEM.

High resolution imaging at low accelerating voltage:

With the tungsten emitter SEM, great skill is required to produce a high resolution image at low voltage. High-resolution images, at high and low voltages, are easily produced with the S-4700 FESEM.

Accelerating voltage can be changed in smaller increments:

The kV can be changed by 1 kV increments on the FESEM, rather than in increments of 5 kV on the tungsten filament SEM. The lowest accelerating voltage the FESEM can achieve is 0.5 kV.

More control of working distance range:

Working distance can be changed in less than 1 mm increments, from 1 mm to 27 mm.

Windows based software makes operation easier because of its more user friendly interface:

Familiarity with Windows operating system software leads to greater productivity, and integrated column controls make switching between operating modes quick and easy. Fewer manual adjustments of the column are required.

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